Manufacturers pick EUV combos
Co-optimisation tools are now becoming mainstream to help translate between different worlds of chip designers and lithographers.
Review system inspects mask at EUV level
Inspections of up to 14nm mask defects or a detector supporting 2,000Hz frame rate are just two uphill tests to…
Vibration analytics-based system predicts IIoT faults
The Harman Quick Predict is an end-to-end warning solution for industrial Internet of Things based on vibration analytical algorithm.
Multi-core parallel engine powers Cadence simulator
The Xcelium Parallel Simulator speeds runtime by an average of 3X for register-transfer level design simulation.
ZTE achieves deep learning benchmark via Intel FPGA
ZTE achieves a record–beyond a thousand images per second in facial recognition–known as “theoretical high accuracy” for its custom topology.
Coverity 8.7 boosts analysis for mobile, web apps
Coverity tool’s 8.7 version expands and enhances analysis via plugins with IDEs like Android Studio, Microsoft Visual Studio, IntelliJ and…
Dark mode solves nanoparticle lasing issues
Aalto University researchers achieve low beam divergence of 0.3 degree and spatial coherence lengths of 100μm, useful for out-coupling mechanisms.
Analyser measures up to 0.03MHz low-frequency noise
9812DX sets high-speed record for on-wafer noise characterisation with typical noise measurement time of less than 10s per bias.
Good and bad practices on car system’s robustness
STMicroelectronics has tested its 32bit MCUs in an automotive system, focusing on the connection to signals from different power domains.
Osram 1050nm LED: Match for infrared spectroscopy
Emitting 650nm to 1050nm, the Osram SFH4735 LED serves as a light source for broadband infrared spectroscopy applications like food…