2017-11-28 - Allen Henley, Litepoint

Bluetooth 5: More speeds, more range, new RF tests

Bluetooth keeps evolving as new applications for the wireless technology arise. Bluetooth 5 adds features that will appeal to designers…

2017-10-25 - Brad Jolly, Keysight Technology

LoRaWAN Test Challenges

LoRaWAN is a very scalable technology that supports both private and public use models with relatively low infrastructure compared to…

2017-09-07 - Christoph Pointner

OTA testing to gain importance with 5G

Test and measurement will play a more strategic role compared to earlier wireless technologies, but test equipment and methods still…

2017-08-14 - Keysight Technologies

4 critical success factors for a tech refresh

To maximise your ROI, limit downtime and make a smooth transformation of your test floor, you need a comprehensive cost-effective…

2017-08-11 - CyberOptics

Dual sensor 3D AOI boosts accuracy, reliability

The SQ3000 platform offers users the flexibility to choose a dual MRS sensor option for 3D microscopic image quality at…

2017-08-09 - Keysight Technologies

Keysight tests for 3GPP compliance with Monarch chip

The UXM Wireless Test Set is integrated with Sequans' Monarch LTE for IoT platform to support the testing needs of…

2017-08-07 - Multitest

Contactor boosts WLCSP test yield

Atlas WLCSP test contactors are claimed to achieve mechanical reliability through the rigid “cruciform” tip used in Multitest's QuadTech flat…

2017-08-04 - Fairview Microwave

VCOs cover 10–4,350MHz frequency band

The oscillators come in a 0.5in hermetically sealed surface mount package designed to meet MIL-STD-883 and MIL-STD-202 environmental test conditions.

2017-07-21 - Oxford Instruments

MoS2 QC helps commercialise smaller devices

Oxford Instruments, with the help of a non-destructive quality control method from UK's NPL, is commercialising MoS2 wafer-scale fabrication technology…

2017-07-19 - Thermo Fisher

Nanoprobing platform enables fast failure analysis

The flexProber system offers precise, repeatable, and stable probe placement on critical level features.