2017-03-09 - Bill Schweber

Testing crimp connections the NASA way

NASA has come up with a real-time, ultrasound-based device that sends an acoustic wave through the crimp assembly as it…

2017-03-08 - Linear Technology

Flyback regulator operates at 150°C in 100V VIN range

Linear Technology’s LT8304/-1 isolated flyback regulator generates up to 24W and produces 1kV output voltage in ±5% regulation result.

2017-03-06 - Kurt Shuler

Auto SoC reference platform accelerates design time

DCT’s SoC has been tapped by European THINGS2DO project to help create a camera-based ADAS reference platform using its data…

2017-03-06 - Rick Merritt

Review system inspects mask at EUV level

Inspections of up to 14nm mask defects or a detector supporting 2,000Hz frame rate are just two uphill tests to…

2017-03-06 - Rick Merritt

Manufacturers pick EUV combos

Co-optimisation tools are now becoming mainstream to help translate between different worlds of chip designers and lithographers.

2017-03-06 - Rick Merritt

EUV lithography scanner aims to produce 104 wafers/h

The ASML NXE:3400B EUV lithography scanner runs at 148W to produce 104 wafers/h, capable of creating overlays within a 3nm…

2017-03-06 - Seoul Semiconductor

LED modules offer up to 4,650 lumens

The Y19 module consists of four clusters of 2 x 2 LEDs with a combined typical flux of 4,650 lumens.

2017-03-03 - Semtech

Wireless charging platform uses single transmitter

Semtech’s LinkCharge LP delivers 1W power to several low-power devices using a single transmitter.

2017-03-03 - Judith M. Myerson

Can grid computing cover electronics supply fail?

Grid computing supports multi-units sharing with the use of software that split and farm out pieces of a programme into…

2017-03-02 - Harman

Vibration analytics-based system predicts IIoT faults

The Harman Quick Predict is an end-to-end warning solution for industrial Internet of Things based on vibration analytical algorithm.