2003-03-05 -

Micron breaks mega-pixel barrier with CMOS image sensor

Micron Technology Inc. launched its most significant salvo yet against the charged coupled device (CCD) camp, introducing its first mega-pixel…

2003-02-11 -

CSI to take part of Synopsys interoperability program

Circuit Semantics Inc. (CSI), a provider of modeling and characterization solutions for high-performance IC design, has joined the Synopsys in-Sync…

2003-01-09 - Michael Santarini

EDA industry reports another quarter of shrinking sales

EDA industry revenues have declined for three consecutive quarters, and were down 5.1 percent in the first nine months of…

2002-06-04 - Ron Wilson

World needs fewer chip suppliers, analyst says

As if a lousy business climate weren’t bad enough, there’s more to worry about for semiconductor manufacturers. “The simple fact…

2002-04-30 - Sara Sowah

Polymer transistors hint at all-organic displays

Researchers at Pennsylvania State University have built an active-matrix (AM) LCD that uses polymer transistors in place of silicon devices.…

2002-03-15 - Rick Merritt

Consortium may take over Bell Labs research facility

Lucent Technologies and Agere Systems Inc. are attempting to spin-off their nanotechnology and electron-beam lithography lab in Murray Hill, New…

2002-01-09 -

Lineo, Metrowerks, Motorola set up content lab

Lineo, Metrowerks, and Motorola Broadband Communications Sector have joined forces to form Triarc Content Labs, in order to facilitate the…

2001-09-10 -

Bonding mirrors to mounts

This application note discusses the best technique in applying adhesive to bond mirrors to mounts. View the PDF document for…

2001-05-04 - Leor Brenman

How can comb filters be used to synthesize musical instruments on a TMS320 DSP?

This application note presents a DSP implementation of a model for synthesizing plucked strings based on the Karplus Strong Plucked-String…

2000-12-08 - Bob Botos

Nanosecond pulse handling techniques in IC interconnections

This application note is intended to discuss the most common, yet perhaps not well-known, pitfalls of measurement systems, a method…