3-axis MEMS accelerometers detect structural defects

Article By : Susan Nordyk

The analog-output ADXL354 and digital-output ADXL355 offer selectable measurement ranges of ±2g to ±8g and low 0g offset drift.

Analog Devices' three-axis MEMS accelerometers, the ADXL354 and ADXL355, perform high-resolution vibration measurement to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the devices lengthens battery life and reduces the time between battery changes.

The analog-output ADXL354 and digital-output ADXL355 offer selectable measurement ranges of ±2g to ±8g and low 0g offset drift. Both accelerometers provide guaranteed temperature stability with null offset coefficients of 0.15mg/°C maximum. The ADXL354 boasts ultralow noise density (all axes) of 20µg/√Hz and current consumption of just 150µA in measurement mode. The ADXL355 has a noise density of 25µg/√Hz and current consumption of 200µA in measurement mode. Standby-mode current consumption is just 21µA for each device.

The accelerometers are housed in 6mm × 6mm, 14-lead LCC packages, which are hermetically sealed to ensure long-term stability. These devices can be used for a variety of applications in aerospace, defence, process control, industrial automation, energy and healthcare. They operate over a temperature range of -40°C to 125°C and include an integrated temperature sensor and electromechanical self-test.

In lots of 1000 units, the ADXL354 and ADXL355 cost $25.42 and $28.25, respectively.

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